LT-STM/AFM

LT-STM/AFM System

The low temperature scanning tunneling microscope (LT-STM) from our partner CreaTec Fischer & Co. GmbH in Germany is an essential part of our product range. The instrument is continuously being developed and offers ultimate STM, STS, and IETS performance including one of the highest LHe hold times, extremely low drift rates and outstanding stability compared to similar low-temperature machines.

Apart from its Nano-analytical capabilities the instrument allows for sophisticated spectroscopy and atom manipulation experiments as well as studies of metals, semiconductors, superconductors, and carbon at low temperature. Furthermore, the LT-STM/AFM is also well adapted for experiments at variable temperature in the temperature range from 5 to 300 K (optional down to 3 K).

A fully compatible low temperature atomic force microscope (AFM) allows for simultaneous measurements of force and tunnelling current.

All our scanning heads are available as single STM or combined STM/AFM version.

Key Specifications

  • Ultra stable at low temperatures (highest stability, lowest drift)
  • Low LN2 and LHe consumption
  • Cold sample transfer
  • Molecular manipulation
  • Easy-to-handle software and hardware
  • Simultaneous STM and AFM measurements
  • Available with Besocke or Slider type scanning heads

Looking for a custom solution? No problem - let us know and we will work with you.

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